About

Bin Chen is a highly skilled Manufacturing Technology RD Program Technical Manager at TSMC with over 14 years of relevant experience. He has a strong background in data analytics, with expertise in supervised learning, data science, research science, and CNN. Bin has worked on several transformation projects related to data analytics and has extensive experience in multivariate sensor anomaly detection using CNN, LSTM, and ConvLSTM with attention mechanism. He has also worked on abnormal time series detection projects using LSTM Autoencoder and die-level failure mode auto-classification projects using CNN Autoencoder and unsupervised learning methods. Bin has a proven track record of success in providing technical mentorship, and he has participated in technical mentorship programs, providing mentorship for senior engineers. Before joining TSMC, Bin worked as a Principal Engineer at Micron Technology, where he gained valuable experience in process control systems. Bin has a Master's degree in Industrial Systems Engineering from the National University of Singapore, where he specialized in data analytics. He is a highly motivated and dedicated professional who is passionate about using data analytics to drive business success. He is a quick learner and is always eager to learn new technologies and techniques to improve his skills. Overall, Bin Chen is an accomplished Manufacturing Technology RD Program Technical Manager with extensive experience in data analytics and a proven track record of success. He is an asset to any organization and is committed to driving business success through the use of data analytics.